NEO ALFA ASSAY SIPIN – SDD – FSDD
The NEO ALFA ASSAY SIPIN with SDD and optional FSDD technology offers exceptional accuracy for precious metal assay and trace element analysis. Its advanced detector technology ensures high throughput and reliable results for demanding applications in assaying and research.
Key Details:
Silicon Drift Detector (SDD) Technology
Fast SDD (FSDD) Option for High Throughput
Ideal for Assaying and Research
