NEO ALFA ASSAY SIPIN – SDD – FSDD

NEO ALFA ASSAY SIPIN – SDD – FSDD

NEO ALFA FSDD / SDD / SI-Pin

High-Performance X-Ray Fluorescence Analyzer

Fast. Accurate. Compact.
Neo ALFA FSDD / SDD / SI-Pin is a next-generation XRF analyzer designed for quick, non-destructive material composition and coating thickness testing. Built for hallmarking centers, tunch labs, and jewelry showrooms, this system offers a compact design with unmatched speed and precision.

Compact Benchtop Design | Direct Shooting X-Ray | Fast Certification with PC Software
Real-Time Camera View | 2-Year Warranty

Product Introduction

Accuracy

Advanced micro-focus X-Ray tube and silicon detector for unmatched precision.

Accuracy

Advanced micro-focus X-Ray tube and silicon detector for unmatched precision.

Accuracy

Advanced micro-focus X-Ray tube and silicon detector for unmatched precision.

Ease of Use

One-push operation and real-time camera display ensure simple, guided testing.

Ease of Use

One-push operation and real-time camera display ensure simple, guided testing.

Ease of Use

One-push operation and real-time camera display ensure simple, guided testing.

Durability

Solid-state design, long-life tube, and certified electronics for rugged performance.

Durability

Solid-state design, long-life tube, and certified electronics for rugged performance.

Durability

Solid-state design, long-life tube, and certified electronics for rugged performance.

Advantage

High Accuracy

Real-time composition and karat result within seconds.

High Accuracy

Real-time composition and karat result within seconds.

High Accuracy

Real-time composition and karat result within seconds.

Fast Analysis

Analyze up to 25 elements simultaneously with clear certification results.

Fast Analysis

Analyze up to 25 elements simultaneously with clear certification results.

Fast Analysis

Analyze up to 25 elements simultaneously with clear certification results.

Portability

Compact and lightweight for convenient benchtop placement.

Portability

Compact and lightweight for convenient benchtop placement.

Portability

Compact and lightweight for convenient benchtop placement.

Built-in Result Management

Easy data access and reporting through integrated PC software.

Built-in Result Management

Easy data access and reporting through integrated PC software.

Built-in Result Management

Easy data access and reporting through integrated PC software.

Bluetooth-Enabled Printing

Supports wireless printing of reports and certifications.

Bluetooth-Enabled Printing

Supports wireless printing of reports and certifications.

Bluetooth-Enabled Printing

Supports wireless printing of reports and certifications.

One-Click Intelligence

Auto-calibration and intuitive UI for seamless operation.

One-Click Intelligence

Auto-calibration and intuitive UI for seamless operation.

One-Click Intelligence

Auto-calibration and intuitive UI for seamless operation.

Benefits

Lightning-fast composition & karat testing

Certified for showroom, hallmarking, and lab-grade use

Direct shooting for fast, accurate reads

High-resolution camera for customer transparency

Real-time result display & export

Designed for compact desktop usage

Supports multi-layer & coating thickness testing

Integrated system with minimal maintenance

Recommend users

Jewellery Showrooms

Gold Testing Labs

Hallmarking Centers

Banks & NBFCs

Pawn Brokers

Government Certification Bodies

Refiners & Smelters

Technical Institutes

Technical Specifications

NEO ALFA FSDD / SDD / SI-Pin

Specifications

X-ray Excitation

50W (50kV, 1mA) micro-focused Wanode tube

Detector

Silicon solid state detector (190eV resolution or better)

Analysis Capability

5 layers (4 + base), 10 elements/layer, up to 25 elements simultaneously

Filters/Collimators

4 primary filters / single collimator (optional dual)

Camera Optics

1/4” CMOS, 1280×720 VGA resolution

Power Supply

150W, 100–240V, 47–63Hz

Dimensions (HxWxD)

325mm × 200mm (12”); Exterra: 325mm, 350mm, 450mm

Processor

Intel Core i5 3470 (3.2GHz), 8GB DDR3

Operating System

Microsoft Windows 10 Professional (64-bit)

Signal Processing

4096-channel analyzer, auto dead time & escape peak correction

Focal Depth

Single fixed focal depth with laser-based auto focus

Weight

25 kg

Video Magnification

20x Standard

Optional Manual XY Stage

Table size: 11” × 10”, travel: 1.5” × 1.5”

Working Environment

10°C–40°C, up to 98% RH non-condensing

Element Range

From Aluminum (13) to Uranium (92)

Element Range

From Aluminum (13) to Uranium (92)

Key Details:

Silicon Drift Detector (SDD) Technology

Fast SDD (FSDD) Option for High Throughput

Ideal for Assaying and Research

Have specific requirements?

Discuss Your Needs with Our Experienced Team.

Have specific requirements?

Discuss Your Needs with Our Experienced Team.

Have specific requirements?

Discuss Your Needs with Our Experienced Team.

Neo Instrument specializes in XRF technology and offers award-winning spectrometers for element analysis, RoHS compliance, and noble metal testing.

Office Address

7078/9, Rameshwari Nehru Nagar, Karol Bagh, New Delhi - 110005, Delhi, India

© 2025 Neo Instrument Co. All Rights Reserved.

Neo Instrument specializes in XRF technology and offers award-winning spectrometers for element analysis, RoHS compliance, and noble metal testing.

Office Address

7078/9, Rameshwari Nehru Nagar, Karol Bagh, New Delhi - 110005, Delhi, India

© 2025 Neo Instrument Co. All Rights Reserved.