Key Details:
Silicon Drift Detector (SDD) Technology
Fast SDD (FSDD) Option for High Throughput
Ideal for Assaying and Research
NEO ALFA FSDD / SDD / SI-Pin
High-Performance X-Ray Fluorescence Analyzer
Fast. Accurate. Compact.
Neo ALFA FSDD / SDD / SI-Pin is a next-generation XRF analyzer designed for quick, non-destructive material composition and coating thickness testing. Built for hallmarking centers, tunch labs, and jewelry showrooms, this system offers a compact design with unmatched speed and precision.
Compact Benchtop Design | Direct Shooting X-Ray | Fast Certification with PC Software
Real-Time Camera View | 2-Year Warranty
Product Introduction
Accuracy
Advanced micro-focus X-Ray tube and silicon detector for unmatched precision.
Ease of Use
One-push operation and real-time camera display ensure simple, guided testing.
Durability
Solid-state design, long-life tube, and certified electronics for rugged performance.
Advantage
High Accuracy
Real-time composition and karat result within seconds.
Fast Analysis
Analyze up to 25 elements simultaneously with clear certification results.
Portability
Compact and lightweight for convenient benchtop placement.
Built-in Result Management
Easy data access and reporting through integrated PC software.
Bluetooth-Enabled Printing
Supports wireless printing of reports and certifications.
One-Click Intelligence
Auto-calibration and intuitive UI for seamless operation.
Benefits
Lightning-fast composition & karat testing
Certified for showroom, hallmarking, and lab-grade use
Direct shooting for fast, accurate reads
High-resolution camera for customer transparency
Real-time result display & export
Designed for compact desktop usage
Supports multi-layer & coating thickness testing
Integrated system with minimal maintenance
Recommend users
Jewellery Showrooms
Gold Testing Labs
Hallmarking Centers
Banks & NBFCs
Pawn Brokers
Government Certification Bodies
Refiners & Smelters
Technical Institutes
Technical Specifications
NEO ALFA FSDD / SDD / SI-Pin | Specifications |
|---|---|
X-ray Excitation | 50W (50kV, 1mA) micro-focused Wanode tube |
Detector | Silicon solid state detector (190eV resolution or better) |
Analysis Capability | 5 layers (4 + base), 10 elements/layer, up to 25 elements simultaneously |
Filters/Collimators | 4 primary filters / single collimator (optional dual) |
Camera Optics | 1/4” CMOS, 1280×720 VGA resolution |
Power Supply | 150W, 100–240V, 47–63Hz |
Dimensions (HxWxD) | 325mm × 200mm (12”); Exterra: 325mm, 350mm, 450mm |
Processor | Intel Core i5 3470 (3.2GHz), 8GB DDR3 |
Operating System | Microsoft Windows 10 Professional (64-bit) |
Signal Processing | 4096-channel analyzer, auto dead time & escape peak correction |
Focal Depth | Single fixed focal depth with laser-based auto focus |
Weight | 25 kg |
Video Magnification | 20x Standard |
Optional Manual XY Stage | Table size: 11” × 10”, travel: 1.5” × 1.5” |
Working Environment | 10°C–40°C, up to 98% RH non-condensing |
Element Range | From Aluminum (13) to Uranium (92) |
Element Range | From Aluminum (13) to Uranium (92) |
