Neo TH7

The NEO CP-TH7 is the latest X-ray fluorescence spectrometer launched by CIPU Technology, designed for the analysis and detection of multi-layer complex coatings. It is highly suitable for measuring electroplating thickness in small areas.

Compact X-Ray Fluorescence for Small Area Testing
The NEO CP-TH7 is a compact, benchtop XRF spectrometer designed specifically for micro-area testing and quality assurance of coatings on electronic, automotive, and hardware components. Its accurate, fast, and stable performance ensures precise thickness and elemental composition analysis.

Product Introduction

Accuracy

RSD <1% Accuracy: Measurement stability is highly precise.

Speed

Fast 10-30s Test Time: Quickly analyzes complex samples.

Stability

Excellent Stability: Data consistency using a powerful FP algorithm.

Advantage

Top Illumination

Allows precise XRF analysis on small local areas

High-Resolution Imaging

12-megapixel clarity easily identifies the test spot.

Versatile Detection

Measures 1-5 layers and plating solution content.

Multi-Collimators

Six standard spot sizes for all material testing.

Easy Positioning

Manual XY platform for simple test area setup.

Benefits

Comprehensive Data: Displays element composition as ratio, atomic percentage, or mass percentage.

Adopts the MultiRay-FP algorithm for data stability.

Allows one-click printing of result reports with custom headers.

Displays statistical data including $\text{RSD}$, max, min, and average values.

Key Details:

Ultra-Low Limit: XRF detection limit of

0.001 µm.

Long Tube Life: X-ray tube life exceeds 20,000 hours.

Flexible Source: Standard Mo target with optional W and Rh targets.

Recommend users

Electroplating Thickness

Hardware & Connectors

Electronics & Cables

Solution Analysis

Technical Specifications

NEO CP-TH7

SPECIFICATIONS

Detection Items

Single, Multi-layer, Composite, Alloy Substrate, Glass, Plastic coatings, and Electroplating solution.

Detection Layer Range

1-5 layers.

X-ray Tube

Standard Mo target $0.1mm micro-focus X-raytube (optional W and Rh).

Detector

Electrically cooled Si-PIN (145 += 5eV), optional SDD (1255 += eV).

Collimation System

6 Spot sizes: 0.1mm, 0.2mm, 0.3mm, 0.4mm, 0.5mm, 1mm.

Camera Positioning

12-megapixel resolution, crosshair, adjustable focus.

Sample Chamber

300mm*300mm*120mm.

Overall Dimensions

500mm*380mm*360mm.

Weight

42Kg.

Radiation Protection

Compliant with GB18871-2002 and GBZ115-2002 standards.

Have specific requirements?

Discuss Your Needs with Our Experienced Team.

Neo Instrument specializes in XRF technology and offers award-winning spectrometers for element analysis, RoHS compliance, and noble metal testing.

Office Address

7078/9, Rameshwari Nehru Nagar, Karol Bagh, New Delhi - 110005, Delhi, India

© 2025 Neo Instrument Co. All Rights Reserved.

Neo Instrument specializes in XRF technology and offers award-winning spectrometers for element analysis, RoHS compliance, and noble metal testing.

Office Address

7078/9, Rameshwari Nehru Nagar, Karol Bagh, New Delhi - 110005, Delhi, India

© 2025 Neo Instrument Co. All Rights Reserved.