NEO ALFA FSDD / SDD / SI-Pin
The NEO ALFA ASSAY SIPIN with SDD and optional FSDD technology offers exceptional accuracy for precious metal assay and trace element analysis. Its advanced detector technology ensures high throughput and reliable results for demanding applications in assaying and research.
High-Performance XRF Analyzer
Fast. Accurate. Compact.
The Neo ALFA FSDD / SDD / SI-Pin is a compact XRF analyzer for quick, non-destructive composition and coating tests. With real-time imaging and smart software, it’s perfect for hallmarking centers, tunch labs, and jewelry showrooms.
2-Year Warranty • Tabletop • 100K Hours Laser
Product Introduction
Accuracy
Advanced micro-focus X-Ray tube and silicon detector for unmatched precision.
Ease of Use
One-push operation and real-time camera display ensure simple, guided testing.
Durability
Solid-state design, long-life tube, and certified electronics for rugged performance.
Advantage
High Accuracy
Real-time composition and karat result within seconds.
Fast Analysis
Analyze up to 25 elements simultaneously with clear certification results.
Portability
Compact and lightweight for convenient benchtop placement.
Built-in Result Management
Easy data access and reporting through integrated PC software.
Bluetooth-Enabled Printing
Supports wireless printing of reports and certifications.
One-Click Intelligence
Auto-calibration and intuitive UI for seamless operation.
Benefits
Lightning-fast composition & karat testing
Certified for showroom, hallmarking, and lab-grade use
Direct shooting for fast, accurate reads
High-resolution camera for customer transparency
Real-time result display & export
Designed for compact desktop usage
Supports multi-layer & coating thickness testing
Integrated system with minimal maintenance
Key Details:
Silicon Drift Detector (SDD) Technology
Fast SDD (FSDD) Option for High Throughput
Ideal for Assaying and Research
Recommend users
Jewellery Showrooms
Gold Testing Labs
Hallmarking Centers
Banks & NBFCs
Pawn Brokers
Government lab
Refiners & Smelters
Technical Institutes
Technical Specifications
NEO ALFA FSDD / SDD / SI-Pin | Specifications |
|---|---|
X-ray Excitation | 50W (50kV, 1mA) micro-focused Wanode tube |
Detector | Silicon solid state detector (190eV resolution or better) |
Analysis Capability | 5 layers (4 + base), 10 elements/layer, up to 25 elements simultaneously |
Filters/Collimators | 4 primary filters / single collimator (optional dual) |
Camera Optics | 1/4” CMOS, 1280×720 VGA resolution |
Power Supply | 150W, 100–240V, 47–63Hz |
Dimensions (HxWxD) | 325mm × 200mm (12”); Exterra: 325mm, 350mm, 450mm |
Processor | Intel Core i5 3470 (3.2GHz), 8GB DDR3 |
Operating System | Microsoft Windows 10 Professional (64-bit) |
Signal Processing | 4096-channel analyzer, auto dead time & escape peak correction |
Focal Depth | Single fixed focal depth with laser-based auto focus |
Weight | 25 kg |
Video Magnification | 20x Standard |
Optional Manual XY Stage | Table size: 11” × 10”, travel: 1.5” × 1.5” |
Working Environment | 10°C–40°C, up to 98% RH non-condensing |
Element Range | From Aluminum (13) to Uranium (92) |
Element Range | From Aluminum (13) to Uranium (92) |
